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The measurement of intelligence

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About This Book

The work presents a practical explanation and complete guide to a revised Binet-Simon intelligence scale, outlining its purposes, theoretical basis, and the procedures for administering, scoring, and interpreting tests. It surveys typical uses such as diagnosing retardation, identifying giftedness, vocational guidance, and educational placement, while discussing sources of error and limits of teacher judgment. The revision process and individual test items are described alongside statistical analyses of IQ distribution and validity studies. Detailed instructions, scoring rules, norms, and recommendations for training examiners are provided to enable systematic, standardized measurement of mental ability for educational and clinical decisions.

About the Author

Terman, Lewis M. portrait

Lewis M. Terman

Lewis M. Terman was an American psychologist best known for his pioneering work in the field of intelligence testing. He is particularly recognized for the Stanford-Binet Intelligence Scales, which he developed as a revision of the original Binet-Simon test. Terman's influential publications, such as "The Measurement of Intelligence" and the "Condensed Guide for the Stanford Revision of the Binet-Simon Intelligence Tests," contributed significantly to the understanding and assessment of human intelligence. His research laid the groundwork for future studies in educational psychology and the application of intelligence testing in various contexts.

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